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"State and Fault Information for Compaction-Based Test Generation."
Ashish Giani et al. (2002)
- Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal:
State and Fault Information for Compaction-Based Test Generation. J. Electron. Test. 18(1): 63-72 (2002)
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