Doron Myersdorf

Doron Myersdorf

Herzliya, Tel Aviv District, Israel
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Volunteer Experience

  • Mentor

    Atalef Foundation

    - 10 years 1 month

    Economic Empowerment

    The Atalef Foundation, a non-profit organization, is the official association of the Israeli Naval Commandos Unit.

    The Atalef Foundation is dedicated to the support commandos during their active service and their reserve duty. It purpose is to create programs that benefit not only the commandos but all of Israeli society.

Publications

  • Effective measurement and evaluation of R&D quality and productivity

    International Journal of Thermal Sciences - INT J THERM SCI

    R&D productivity is defined as the evaluated ratio between the outputs with their long-term consequences, and the inputs invested in achieving those outputs. The paper describes the methodology of constructing and implementing a measurement and evaluation system for R&D quality and productivity in high-tech industries. It summarizes continuous fieldwork done with five leading Israeli firms, which focused on establishing and implementing such a system

    See publication
  • Simulation of test wafer consumption in a semiconductor facility

    Advanced Semiconductor Manufacturing, IEEE/SEMI Conference and Workshop - ASMC , pp. 298-302, 1998

    A discrete event simulation methodology was developed to assist in managing test wafer usage in semiconductor fabs. The purpose of modeling test wafer usage is to predict the number of new test wafers required, test wafer WIP levels, and how to downgrade test wafers to reduce costs of purchasing new test wafers. The test wafer simulation methodology is a detailed yet accurate way to predict test wafer consumption. The methodology has been implemented in a 200 mm development facility, resulting…

    A discrete event simulation methodology was developed to assist in managing test wafer usage in semiconductor fabs. The purpose of modeling test wafer usage is to predict the number of new test wafers required, test wafer WIP levels, and how to downgrade test wafers to reduce costs of purchasing new test wafers. The test wafer simulation methodology is a detailed yet accurate way to predict test wafer consumption. The methodology has been implemented in a 200 mm development facility, resulting in considerable cost savings by reducing the overall WIP levels of test wafers.

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  • Systems Modeling of the R&D domain

    R&D Management, Oct 1997, Volume: 27 Issue: 4 pp.333-344

    Object process methodology may be used for the system modeling of research and development (R&D) domain. This is a tool used to assist R&D meet the needs of clients. To assess the performance of R&D, the object-process analysis (OPA) can be utilized. The elements of the system, its environment and their interaction may be examined using OPA. The framework used in the paper enables the user to analyze the issues that R&D managers should take note in the management, planning and assessment of R&D.

    Other authors
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  • Roadblocks to productivity improvement in the semiconductor industry

    Air Medical Journal , 1997

    Semiconductor manufacturing is one of the most complicated production environments for such reasons as: reentrant product flows; variant batching; clean room environments (imposing constraints on the layout and operations); complicated equipment to fix; and inherent conflict between the need for customized products on the one hand, and high volume, low cost production on the other. Opportunities for productivity improvement, what the authors call “visions of excellence in semiconductor…

    Semiconductor manufacturing is one of the most complicated production environments for such reasons as: reentrant product flows; variant batching; clean room environments (imposing constraints on the layout and operations); complicated equipment to fix; and inherent conflict between the need for customized products on the one hand, and high volume, low cost production on the other. Opportunities for productivity improvement, what the authors call “visions of excellence in semiconductor manufacturing” are hindered by these roadblocks. They propose some indicators for the identification of each of the top five roadblocks and the possible industrial engineering solutions for tackling each of them. These top five roadblocks have been identified based on their industry experience and the interviews they have had with many managers in the semiconductor industry.

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  • Incorporating manufacturing objectives into the semiconductor facility layout design process: A methodology and selected cases

    Advanced Semiconductor Manufacturing, IEEE/SEMI Conference and Workshop - ASMC , pp. 434-439, 1997

    This paper presents a methodology that provides a vehicle for the selection and ranking of layout design objectives. Moreover, the same methodology can be used to create a decision matrix to evaluate different alternative layouts under analysis. In this case, the methodology combines the ranking of the layout objectives with the relative performance of each layout alternative along each objective in order to recommend the “best” layout alternative. This structured methodology is based on a…

    This paper presents a methodology that provides a vehicle for the selection and ranking of layout design objectives. Moreover, the same methodology can be used to create a decision matrix to evaluate different alternative layouts under analysis. In this case, the methodology combines the ranking of the layout objectives with the relative performance of each layout alternative along each objective in order to recommend the “best” layout alternative. This structured methodology is based on a decision making tool known as the Analytical Hierarchy Process (AHP). These concepts are illustrated through several case studies taken from actual layout design projects in the semiconductor manufacturing industry

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  • Cycle time reduction for semiconductor wafer fabrication facilities

    Advanced Semiconductor Manufacturing, IEEE/SEMI Conference and Workshop - ASMC , pp. 418-423, 1997

    The issue of cycle time reduction and its impact on a company's competitive edge has been gaining considerable attention recently. Generally speaking, shorter cycle times result in better customer satisfaction, lower work-in-process (WIP), higher yield, and better capacity given tool inventory and facility constraints. This paper provides a brief review of key concepts related to cycle time and describes a methodology for cycle time reduction projects in semiconductor wafer fabrication…

    The issue of cycle time reduction and its impact on a company's competitive edge has been gaining considerable attention recently. Generally speaking, shorter cycle times result in better customer satisfaction, lower work-in-process (WIP), higher yield, and better capacity given tool inventory and facility constraints. This paper provides a brief review of key concepts related to cycle time and describes a methodology for cycle time reduction projects in semiconductor wafer fabrication facilities, including the critically important implementation road map step. Finally, a case study is presented to illustrate the effectiveness and potential gains of the proposed cycle time reduction methodology.

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  • The make-or-buy problem: a multidimensional perspective of foundry decisions

    Advanced Semiconductor Manufacturing, IEEE/SEMI Conference and Workshop - ASMC , pp. 197-202, 1996

    This paper discusses the widely known make-or-buy problem. In the semiconductor industry this problem is generally known as the “foundry decision”. This industry has experienced an increased level of wafer fabrication outsourcing in recent years and it is expected that manufacturers will continue to make extended use of foundries in the future. This paper advances the notion that foundry decisions should be assessed along four principal dimensions or objectives: (1) maximization of strategic…

    This paper discusses the widely known make-or-buy problem. In the semiconductor industry this problem is generally known as the “foundry decision”. This industry has experienced an increased level of wafer fabrication outsourcing in recent years and it is expected that manufacturers will continue to make extended use of foundries in the future. This paper advances the notion that foundry decisions should be assessed along four principal dimensions or objectives: (1) maximization of strategic competitive performance, (2) maximization of managerial performance, (3) minimization of sourcing risks, and (4) maximization of financial performance. This multiple criteria approach avoids the common pitfall of relying exclusively on financial factors when weighing the pros and cons of each sourcing alternative

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  • Staffing analysis tool for operator-machine-lot interference in semiconductor manufacturing

    Advanced Semiconductor Manufacturing, IEEE/SEMI Conference and Workshop - ASMC , pp. 335-340, 1997

    This paper describes the concepts underlying a new staffing tool, which evaluates staffing requirements, plan future shift sizes, perform sensitivity analysis, and locate and measure improvement opportunities in terms of worker operations. The model is based on M/M/S/K queuing theory to analyze the operator-machine-lot (OML) interference especially in semiconductor manufacturing processes. Unlike classical approaches, in which the machines are treated as customers, here wafer lots are taken as…

    This paper describes the concepts underlying a new staffing tool, which evaluates staffing requirements, plan future shift sizes, perform sensitivity analysis, and locate and measure improvement opportunities in terms of worker operations. The model is based on M/M/S/K queuing theory to analyze the operator-machine-lot (OML) interference especially in semiconductor manufacturing processes. Unlike classical approaches, in which the machines are treated as customers, here wafer lots are taken as the designated customers to be serviced. A comparison of a simulation, OML, and a traditional M/M/S/K model (where the machines are modeled as customers) shows that OML model yields much closer results to the simulation than the traditional M/M/S/K model. Furthermore, from the computational point of view OML is more efficient than the simulation model which can be very time consuming especially in the complex semiconductor manufacturing environment. Thus, OML model is a superior alternative to the classical interference modeling and facilitates staffing recommendations that improve overall equipment effectiveness (GEE) and therefore productivity

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Patents

  • INTERFACE FOR PRESENTING INFORMATION

    Issued US US2002038299

    A system and method are disclosed for presenting information. Categories are determined for found information by analyzing the content of the information. The categories are correlated with images that represent the categories. Images are displayed that correspond to the categories.

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  • Systems And Methods For Monitoring The Presence Of Assets Within A System And Enforcing Policies

    Filed US 20040225524

    A system can be used to enforce policy driven interactions among any set of objects. The availability of objects within a system is monitored and policies applicable to the objects are enforced. Objects within the system such as users, devices, processes and information assets are assigned unique identifiers and their presence is periodically reported to a server by client agents running in the devices. The availability of an object for a specific interaction may be determined through analysis…

    A system can be used to enforce policy driven interactions among any set of objects. The availability of objects within a system is monitored and policies applicable to the objects are enforced. Objects within the system such as users, devices, processes and information assets are assigned unique identifiers and their presence is periodically reported to a server by client agents running in the devices. The availability of an object for a specific interaction may be determined through analysis of the presence of the object in the system and the presence and attributes of objects required to facilitate the interaction. Policies are associated with each of the objects. When an attempted interaction of objects is detected by a client agent, a license governing the attempted interaction is dynamically generated in accordance with policies associated with each of the objects participating in the interaction. The interaction is thereafter regulated by the client agent in accordance with the dynamically generated license.

    See patent
  • Systems and methods for dynamically generating licenses in a rights management system

    Filed US 20040039594

    Policies that govern the rights of system assets with respect to other system assets are enforced through dynamic generation of a license at a policy engine in response to a request by an asset to exercise a right with respect to another asset. The system assets are objects within the system to which behavior-regulating policies are applied. Typical types of system assets include users, devices, information files, and processes, and many other types of assets may also be defined. Upon receiving…

    Policies that govern the rights of system assets with respect to other system assets are enforced through dynamic generation of a license at a policy engine in response to a request by an asset to exercise a right with respect to another asset. The system assets are objects within the system to which behavior-regulating policies are applied. Typical types of system assets include users, devices, information files, and processes, and many other types of assets may also be defined. Upon receiving a request to exercise a right, the policy engine obtains predefined policies that are relevant to the request, and obtains factual information for evaluating the current state of transient conditions upon which rights are contingent as expressed in the policies. Through evaluation of the policies, the policy engine generates a license that expresses rights or prohibitions of the requesting asset with respect to another specified asset.

    See patent

Honors & Awards

  • 100 LEADERS -- EYE ON ISRAELI TECH

    Wall Street Journal

    EYE ON ISRAELI TECH

  • "The Bloomberg 50" Ones to Watch (2019)

    Bloomberg

    https://www.bloomberg.com/features/2019-bloomberg-50/

  • Bloomberg 50 "Ones to Watch" 2020

    Bloomberg

    StoreDot CEO 1st Israeli CEO named to the Bloomberg Businessweek "Ones to Watch" List

    StoreDot CEO Doron Myersdorf 1st Israeli CEO named to the Bloomberg Businessweek StoreDot CEO Doron Myersdorf 1st Israeli CEO named to the Bloomberg Businessweek.

    Honored alongside some of the world's most influential people that defined 2019 and made an impact in global business over the last year, Myersdorf was named as a prime contender to wind up on next year's Bloomberg 50. This year's…

    StoreDot CEO 1st Israeli CEO named to the Bloomberg Businessweek "Ones to Watch" List

    StoreDot CEO Doron Myersdorf 1st Israeli CEO named to the Bloomberg Businessweek StoreDot CEO Doron Myersdorf 1st Israeli CEO named to the Bloomberg Businessweek.

    Honored alongside some of the world's most influential people that defined 2019 and made an impact in global business over the last year, Myersdorf was named as a prime contender to wind up on next year's Bloomberg 50. This year's list included leaders from finance, politics, tech, and entertainment, who are shaping the world in unexpected ways.

Languages

  • Hebrew

    Native or bilingual proficiency

  • English

    Native or bilingual proficiency

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