About
As an accomplished and business-driven Head of Data and Data Science, I have a proven…
Articles by Alex
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Amazon, Machine Learning, and Gender Bias
Amazon, Machine Learning, and Gender Bias
By Alex Schwarm, Ph.D.
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Confirmation Bias, Competitive Strategy, and Machine Learning
Confirmation Bias, Competitive Strategy, and Machine Learning
By Alex Schwarm, Ph.D.
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Should we make our stars brighter or should we make more people into stars?
Should we make our stars brighter or should we make more people into stars?
By Alex Schwarm, Ph.D.
Activity
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I'm excited to hire 2 Data science interns at Arrive Logistics. Data science integrates into fundamental problems at Arrive including cost…
I'm excited to hire 2 Data science interns at Arrive Logistics. Data science integrates into fundamental problems at Arrive including cost…
Liked by Alex Schwarm, Ph.D.
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Are you mathematically and statistically oriented and looking for a Data Science internship that offers a unique combination of learning and impact?…
Are you mathematically and statistically oriented and looking for a Data Science internship that offers a unique combination of learning and impact?…
Shared by Alex Schwarm, Ph.D.
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Great conversation with Mary O'Connell from FreightWaves on the opportunities of AI and machine learning in the logistics industry! Always appreciate…
Great conversation with Mary O'Connell from FreightWaves on the opportunities of AI and machine learning in the logistics industry! Always appreciate…
Shared by Alex Schwarm, Ph.D.
Experience
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Education
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Activities and Societies: President of Texas A&M Martial Arts Club Volunteer Leader and Webmaster of Brazos Animal Shelter
Focus on Analytics/Modeling, Optimization, and Control Theory
Awards
Best Presentation Texas A&M University Graduate Student Symposium, 1st Place
Celanese Excellence Award in Chemistry and Chemical Engineering
Dow Chemical Graduate Fellowship
Volunteer Experience
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Coordination, Preparation, and Logistics
Operation Turkey
- Present 6 years 10 months
Poverty Alleviation
Publications
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All Models are Wrong, But Some are Useful... Especially with the Right Data
Data Science Salon - Austin
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Predictive Maintenance of Wire Breakage and Quality Yield of Wire Saw Tools with Multivariate Limit Model
EUPVSEC
Other authors -
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Proactive Equipment Process Control for PV Manufacturing
SNEC Conference, Shanghai
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Why PV Manufacturers Need Proactive Equipment Process Control
SOLARCON 2010 cSi Technology, Shanghai
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Adaptive Multivariate Fault Detection for Semiconductor Processing
Advanced Equipment Control / Advanced Process Control Conference (AEC/APC), Indian Wells
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Advanced Process Control for Dep-Etch Module
Advanced Equipment Control / Advanced Process Control Conference (AEC/APC) XIV, Salt Lake City
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Advanced Process Control for Process Tools and Process Modules
Invited Talk, 3rd European Advanced Equipment Control / Advanced Process Control Conference (AEC/APC), Dresden
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Advanced Process Control Solutions for Semiconductor Manufacturing
Advanced Semiconductor Manufacturing Conference (ASMC)
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APC for Copper Wiring Module
Advanced Equipment Control / Advanced Process Control Conference (AEC/APC) XIV, Salt Lake City
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Wafer-To-Wafer and Within Wafer Advanced Process Control Used in Chemical Mechanical Polishing (CMP)
Advanced Equipment Control / Advanced Process Control Conference (AEC/APC) XIV, Salt Lake City
Patents
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Machine Learning Classifier and Prediction Engine for Artificial Intelligence Optimized Prospect Determination on Win/Loss Classification
Issued US 20180101771
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Feedback control of chemical mechanical polishing device providing manipulation of removal rate profiles
Issued US 8,070,909
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Adaptive multivariate fault detection
US 7,587,296
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Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools
US 7,333,871
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Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects
US 7,937,179
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Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US 7,698,012
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Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US 7,698,012
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Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US 7,725,208
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Factory Level Process and Final Product Performance Control System
US 8,849,438
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Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US 8,694,145
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Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US 7,160,739
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Feedback control of plasma-enhanced chemical vapor deposition processes
US 6,913,938
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Graphical user interface for presenting multivariate fault contributions
US 7,831,326
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Graphical user interface for presenting multivariate fault contributions
US 7,765,020
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Inline defect analysis for sampling and SPC
US 8,799,831
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Integrating tool, module, and fab level control
US 7,047,099
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Integration of fault detection with run-to-run control
US 7,337,019
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Method and apparatus for determining factors for design consideration in yield analysis
US 8,924,904
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Method of feedback control of sub-atmospheric chemical vapor deposition processes
US 7,201,936
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Method, system and medium for controlling manufacture process having multivariate input parameters
US 7,966,087
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Method, system and medium for controlling manufacture process having multivariate input parameters
US 7,272,459
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Method, system and medium for controlling manufacturing process using adaptive models based on empirical data
US 7,668,702
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Method, system and medium for controlling manufacturing process using adaptive models based on empirical data
US 7,970,588
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Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities
US 7,082,345
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Method, system, and medium for handling misrepresentative metrology data within an advanced process control system
US 6,999,836
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Metrics independent and recipe independent fault classes
US 8,010,321
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Ranged fault signatures for fault diagnosis
US 7,596,718
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Ranged fault signatures for fault diagnosis
US 7,934,125
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Scheduling modeling system for adaptive, automated data collection and performance analysis of manufacturing system for optimal scheduling
US 8,483,861
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Stage yield prediction
US 7,962,864
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System, method, and medium for monitoring performance of an advanced process control system
US 7,356,377
Recommendations received
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Applied Materials continues to deliver innovative solutions to meet the challenges of semiconductor manufacturing! Great visualization of the complex…
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7/5晚上國術練習 共6人 若文 擔任教練 茜珍 攝影照相 扶輪社友 父子檔 教會 弟兄 推拿師傅 成員多元，純為興趣健身相聚！ 基本式 楊式太極第一段 六合拳 小五手隊練（攻守練習）、熱身
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Proud to be part of a company which recognizes Juneteenth. Metafora creates space for our people to observe an incredibly important day to reflect on…
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