Chun-Ting "Tim" Wang Lee, PhD

Chun-Ting "Tim" Wang Lee, PhD

Santa Rosa, California, United States
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About

Tim is a Signal Integrity Application Scientist in the PathWave Software and Solutions…

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Experience

  • Keysight Technologies Graphic

    Keysight Technologies

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    Santa Clara

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    Electrical Engineering Department

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    Electrical Engineering Department

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    Department of Computer Science

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    Kaohsiung

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    Department of Electrical Engineering

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    Deparment of Mathematics

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    Department of Electrical Engineering

Education

  • University of Colorado Boulder Graphic

    University of Colorado Boulder

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    Dissertation titled: Test Structures and Economical Non-destructive Measurement Techniques for Multilayer Printed Circuit Board Impedance Characterization. Worked on designing test structures, experiments and workflow in different programs to streamline material property extraction process on PCB's.

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    Activities and Societies: Theta Tau

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Publications

  • Old School RF Structure Meets Modern Signal Integrity: The Beatty Standard

    DesignCon 2016

    In this paper, we introduce a special class of resonant structures-the Beatty standard- along
    with other classic resonators. We examine closely the resonant Beatty standard, its
    impedance profile, loss characteristics, and its application to printed circuit board material
    property extraction. Suited for 32Gbpsec simulation requirements, this proposed supercoupon,
    the Beatty standard, not only provides engineers a compact structure to perform
    material property extraction, but also…

    In this paper, we introduce a special class of resonant structures-the Beatty standard- along
    with other classic resonators. We examine closely the resonant Beatty standard, its
    impedance profile, loss characteristics, and its application to printed circuit board material
    property extraction. Suited for 32Gbpsec simulation requirements, this proposed supercoupon,
    the Beatty standard, not only provides engineers a compact structure to perform
    material property extraction, but also help establish a robust design flow.

    Other authors

  • Novel 5X-Line Technique to Extract Copper Conductivity

    National Radio Science Meeting

    This paper proposes a new characterization technique to extract parameters crucial for calculating the bulk conductivity of copper on printed circuit boards. The 5X-Line technique extracts the final processed sheet resistance, line width, frequency dependent resistance, and inductance of the copper traces on the printed circuit boards.

    Other authors

  • Breaking the 32 Gb/s Barrier: PCB Materials, Simulations, and Measurements

    This presentation shows how to specify the PCB stack-up and how to call out the materials so that the PCBs are manufactured to meet the requirements of high speed designs. It also demonstrates the technique on matching measurements with simulations to create a robust design flow.

    Other authors
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