ANT-20, ANT-20E Advanced Network Tester MTIE / TDEV Analysis
ANT-20, ANT-20E Advanced Network Tester MTIE / TDEV Analysis
Operating Manual
7
BN 3035/98.33
Please direct all enquiries to your
local Wavetek Wandel Goltermann sales
company. The addresses are given at the
end of this handbook.
Copyrights
This product or parts of it are based upon
Recommendations and/or Standards of the
Standardization Sector of the International
Telecommunication Union - ITU-T and/or of the
European Telecommunications Standards Institute -
ETSI. These Recommendations and Standards are
subject to copyrights of these organizations. Without
written permission of the ITU-T and/or ETSI it is not
permitted to copy ITU-T Recommendations or ETSI
standards or parts thereof and/or make them available
to third parties.
Printed in Germany
ANT-20/ANT-20E MTIE/TDEV Analysis
Contents
Introduction
2 Preface. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I-1
3 Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I-1
4 Installation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I-2
5 De-installation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I-2
2 Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-4
2.1 TIE analysis window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-4
2.1.1 TIE menu. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-6
2.1.1.1 Action buttons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-6
2.1.2 Options menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-7
2.2 MTIE analysis window. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-8
2.2.1 Analysis menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-11
2.2.1.1 Action buttons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-12
2.2.2 Export menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-12
2.2.3 Options menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-13
3 Example. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .O-14
3.1 Loading and comparing two recorded TIE curves. . . . . . . .O-14
i
MTIE/TDEV Analysis ANT-20/ANT-20E
ii
ANT-20/ANT-20E MTIE/TDEV Analysis
Introduction
2 Preface
Quick guide for installation and operation of the WWG ANT-20
“MTIE/TDEV Analysis” software, BN 3035/95.21 V.3.03, April 2000.
The “MTIE/TDEV Analysis” software calculates and evaluates the values of MTIE (Maximum
Time Interval Error) and TDEV (Time Deviation) as recommended in ETSI 300 462, ITU-T
G.811, 812 and 813, ANSI T1.101/GR-253 and compares them against the defined masks.
Calculation results are based on wander data gathered using a standard ANT-20 with jitter and
wander options. This short-form manual only describes the operation of the off-line evaluation
software. For details on how to perform a wander measurement with the ANT-20, please refer
to the appropriate section of the ANT-20 Operating Manual.
3 Requirements
The wander data (TIE/Time Interval Error) must be gathered using an ANT-20 with software
version 7.0 or higher. The ANT-20 or ANT-20E must be equipped with the jitter and wander
options to be able to perform the relevant measurements.
MTIE/TDEV evaluation will run on the built-in ANT-20 PC or on any Windows PC with minimum
16 MB RAM and 50 MB free hard disk space (preferably more if long term wander data are to
be evaluated) on drive C:\. The operating system should be Windows 95/98 or Windows NT.
Introduction I-1
MTIE/TDEV Analysis ANT-20/ANT-20E
4 Installation
1. Insert Disk 1/2 “MTIE/TDEV Analysis” software into the floppy drive “A:” of the ANT-20 or of
a Windows PC.
2. Run “A:\SETUP.EXE” from the “Start” menu.
3. Follow the instructions displayed on the screen.
After successful installation, you can run the analysis software by clicking on the “TIE &
MTIE_TDEV analysis” item in the “Start” menu (“TIE & MTIE_TDEV analysis” group).
– or –
If the “MTIE/TDEV Analysis” software has been installed on the ANT-20, you can also start it
from the “Jitter Generator/Analyzer” VI of the ANT-20 with the “TIE Analysis” command in the
“View” menu or with the “TDEV” icon in the toolbar.
5 De-installation
1. Click on the “Uninstall TIE & MTIE_TDEV analysis” item in the “Start” menu
(“TIE & MTIE_TDEV analysis” group).
2. Follow the instructions displayed on the screen.
If de-installation is successful, the analysis software is deleted from the hard disk.
I-2 Introduction
ANT-20/ANT-20E MTIE/TDEV Analysis
3. When the recording is finished, click on “MTIE/TDEV Offline Analyzer” in the “View” menu of
the “Jitter Generator/Analyzer” VI or click on the “TDEV” icon in the toolbar.
The “TIE analysis” window opens.
The data from the last version of “WANDMSEC.BIN” to be saved will be loaded automatically
(see Fig. O-3).
• “TIE analysis” window: Display of loaded TIE data and marker positions.
• “MTIE analysis” window: Display of calculated values for MTIE and TDEV (MADEV, ADEV)
and the tolerance masks.
Proceed as follows:
1. First load a file containing TIE data. see Sec. 1.1, Page O-3 and
(The last version of “WANDMSEC.BIN” is loaded Sec. 2.1.1, Page O-6
automatically if the software is started from the “Jitter
Generator/Analyzer” VI.)
– or –
Simulate TIE data. see Sec. 1.2, Page O-3 and
Sec. 2.1.1, Page O-6
2. Use the cursors to select a range of values if required. see Sec. 2.1, Page O-4
3. Change to MTIE/TDEV Analysis. see Sec. 2.1.1, Page O-6
4. Select a tolerance mask. see Sec. 2.2, Page O-8
5. Calculate the values. see Sec. 2.2.1, Page O-11
6. Print out the graph if required. see Sec. 2.2.1, Page O-11
7. Export the data in “CSV” format if required. see Sec. 2.2.2, Page O-12
To load TIE wander data gathered with the ANT-20, click on the “Load” action button and select
the binary file containing the data you want to evaluate.
See also Sec. 2.1.1, Page O-6.
After an ANT-20 measurement is completed, a file named “WANDMSEC.BIN” is always
available automatically in the “C:\ANT20\RESULTS” folder. It contains the raw data for sample
rates of 1, 30, 60 or 300 per second. If you renamed this file beforehand, you should load the
renamed binary file.
It is also possible to load “*.CSV” ANT-20 data. Simply enter the appropriate file name, e.g.
“WANDMSEC.CSV”.
After the raw data have been loaded, a graph showing TIE versus time is displayed in the “TIE
analysis” window.
Data are organized in blocks. A block runs from the start of the measurement to the next
occurrence of an alarm condition or “Stop”, or from the end of an alarm condition to the start of
the next alarm condition or “Stop”. If the measurement is uninterrupted (i.e. no alarm condition
occurs during the gate time), there will be only one block of measurement data. The evaluation
applies to one block only. It is not possible to extend an evaluation over more than one block.
You can load up to four binary files and display them in the “TIE analysis” window at the same
time. The graphs are displayed in different colors. However, only the last file loaded is used to
calculate the MTIE/TDEV values.
Extensive simulation facilities are provided for demonstration purposes and to help you become
familiar with some of the characteristics of MTIE/TDEV evaluation. Also refer to
Sec. 2.1.1, Page O-6. The “Simulation - TIE data generation” window opens. In this window you
can select up to three different phase deviation characteristics that may be superimposed. The
selections available are “white noise”, “linear and square with selectable amplitude”, and
“sinewave with selectable amplitude and frequency”.
2 Functions
The TIE data are displayed in the “TIE analysis” window when you have loaded a data file.
Marker functions
The red and blue markers are used to select a section of the graph. The black marker can only
be moved along the graph itself. Markers are moved using the mouse or the trackball. The three
marker positions are indicated in text boxes at the bottom of the window. You can also enter
values in these boxes using the keyboard.
Additional displays
The “Drift rate” and “Frequency offset” are displayed on the right next to the marker position
values.
If you activate the “eliminate” check box, a second graph is displayed for which the frequency
offset has been compensated out.
second graph
(frequency offset
ignored)
Fig. O-4 “TIE analysis” window with TIE data (“eliminate” check box activated)
The “Frequency offset” and “Drift rate” are refreshed for the area that is set by the cursors.
The values of “Frequency offset” and “Drift rate” are frozen if the “eliminate” check box is
activated. “Zoom in” is activated automatically. “Zoom out” is no longer possible.
If the “eliminate” check box is deactivated, the last TIE data displayed will be reloaded and
displayed over the full time range.
Color mark
Load TIE data ... Opens the “Load data file” window. You can select a file containing
TIE data captured using an ANT-20 (file name extension “*.BIN” or
“*.CSV”) from this window. Up to four TIE graphs can be displayed at
the same time.
1 C:\...\testdata\wandmsec.bin List of the last files loaded (up to four).
2 ...
Simulate TIE data ... Opens the “Simulation - TIE data generation” window. You can
simulate TIE data from this window.
Print TIE graph Opens the “Comment” and “Print” windows for printing the graph.
Clear TIE graph Clears the TIE graph display.
Copy TIE graph to clipboard Copies the TIE graph onto the Windows clipboard.
MTIE / TDEV analysis Switches to the “MTIE/TDEV analysis” window.
Exit Closes the “TIE analysis” window.
The action buttons correspond to the following commands in the “TIE” menu:
TIE Y axis LOG scale Switches to logarithmic display for the Y axis.
TIE X axis LOG scale Switches to logarithmic display for the X axis.
About Opens the “About MTIE / TDEV Analysis” window with information
about the software.
When you click on the “Analysis” button, the MTIE/TDEV values are first calculated from the TIE
data that have been loaded and then displayed in the “MTIE analysis” window.
Fig. O-8 “MTIE analysis” window with MTIE and TDEV data and ETSI tolerance masks
Joining up the MTIE, TDEV, MADEV and ADEV values with straight lines
The calculated values for MTIE, TDEV, MADEV and ADEV will be joined up by straight lines
when you activate the check box in front of “connect points”. Intermediate values are not
calculated.
Graphics documentation
Use the “Copy analysis graph to clipboard” command in the “Analysis” menu to document the
graph in other Windows applications such as WinWord, or use the “Print analysis graph”
command to obtain a printout.
Interface Standard
OC-N T1.101
PRS T1.101
PRC G.811
Table O-3 Pre-defined tolerance masks to ANSI, ETSI and ITU-T standards
To generate your own mask, you must first create a “TXT” format file with the same format as
one of the mask files supplied by Wavetek Wandel Goltermann. The format is simple: x-MTIE,
y-MTIE, x-TDEV, y-TDEV.
• Tolerance mask: The specified points as well as the interpolated values will be used for the
comparison.
• Analysis curve: Only the individual result points from the analysis are used for the
comparison. The points on the interpolated lines are not compared. They
merely improve the optical display (see Fig. O-8).
Example:
Case 1: The MTIE/TDEV value is compared with the tolerance mask value and assessed.
Case 2: The intersection between the line and the tolerance mask is not compared or
assessed.
Case 3: The MTIE/TDEV value is compared with the interpolated value of the tolerance
mask and assessed.
Changing the color of the graph and the corresponding tolerance mask
A color palette opens if you click on one of the check boxes with a color mark in the lower left
corner of the “MTIE analysis” window. You can select a different color for the graph and the
corresponding tolerance mask (when displayed) here. The “More” button opens the “Select
Color” window where you can define and select further colors.
Fig. O-11 Changing the color of the graph and the corresponding tolerance mask
Start analysis Starts calculation of MTIE/TDEV values for the section of the graph
in “TIE analysis” that is defined by the markers.
Print analysis graph Opens the “Comment” and “Print” windows for printing out the
graph using the printer connected. It is possible to insert a user-
defined comment for this graph which may be helpful for future
reference.
Clear analysis graph Clears the MTIE/TDEV graph display.
Copy analysis graph to clipboard Copies the MTIE/TDEV graph to the Windows clipboard.
Goto TIE graph Switches to the “TIE analysis” window.
The action buttons correspond to the following commands in the “Analysis” menu:
Export MTIE results Opens the “Save MTIE/TDEV results” window. You can specify a
name for the export file in this window. The MTIE results are saved
as “CSV” data in this file. This “CSV” file can then be loaded into
standard Windows applications such as Microsoft Excel for further
data processing and printing purposes.
Export TDEV results Opens the “Save MTIE/TDEV results” window. You can specify a
name for the export file in this window. The TDEV results are saved
as “CSV” data in this file. This “CSV” file can then be loaded into
standard Windows applications such as Microsoft Excel for further
data processing and printing purposes.
Analysis with MADEV & ADEV Adds the “MADEV” (Modified Allan Deviation) and “ADEV” (Allan
Deviation) check boxes to the “MTIE analysis” window. If these
check boxes are activated, the graphs for MADEV and ADEV will
also be displayed when you click on the “Analysis” action button.
TDEV settings Opens the “Settings for TDEV” window. You can select a value for
the observation time for the TDEV calculation from a list box here.
The selected observation time is shown in the graph,
e.g.: TDEV: N/12 - rec. O.172, TDEV: N/6 - not rec.
or TDEV: N/3 - not rec.
3 Example
You can load and display up to four TIE curves at the same time.
✓ The “MTIE/TDEV Analysis” software is running.
✓ The data were recorded using the same sample rate.
1. Load the first file, e.g. “TDEV_10_99new.csv”.
The TIE data are displayed in the “TIE analysis” window.
2. Click on the “MTIE/TDEV ...” button.
The “MTIE analysis” window opens.
3. Click on the “Analysis” button.
The MTIE values will be calculated and displayed.
4. Click on the “Goto TIE graph” button.
The “TIE analysis” window is placed on top.
5. Load the next file, e.g. “TDEV_test1.bin”.
The data from the second file are displayed in addition to those from the first file. The data
can be compared visually (see Fig. O-15).
6. Click on the “Analysis” button.
The MTIE values for the last file loaded will be calculated and displayed (see Fig. O-16).
7. Change the color of the second set of calculated values to distinguish them from the first.
The MTIE values can now be compared visually.
Note: The TIE data must have the same sample rate. The tolerance mask assessment always
applies to the last TIE curve selected.
Fig. O-15 “TIE analysis” window with TIE data loaded from two files
MTIE values
calculated from
“TDEV_test1.bin”
MTIE values
calculated from
“TDEV_10_99new.csv”
Result of tolerance
mask assessment for
the last file loaded
Fig. O-16 MTIE values calculated from data loaded from two files.
4 Calculation formulae
Key to all formulae:
Expression Meaning
N
∑
0.006 2i 1
y = ------------- x i ---------------- – -------------
2
Nτ 0
i=1 N –1 N–1
The analysis yields a single numerical value that can also be determined for a selected TIE
segment.
N 2
∑
0.06 6i 6i 1
D= ------------ x i --------------------------------- – ------------------------------------------- + ------------------------------
4 2 3 2 2
Nτ20 i = 1 N – 5N + 4 N – N – 4N + 4 N – 3N + 2
max x ( i ) – min x ( i )
MTIE ( nτ 0 ) ≅ 1 ≤max
k ≤ N – n k ≤ i ≤ k + n k≤i≤k+n
n = 1, 2, ..., N-1
The above is a point estimate and is obtained for measurements over a single measurement
period.
TDEV: A measure of the expected time variation of a signal as a function of integration time.
TDEV can also provide information about the spectral content of the phase (or time) noise of a
signal. TDEV is in units of time and is based on the sequence of time error samples.
TDEV can be estimated from:
2
N – 3n + 1 n + j – 1
∑ ∑ ( xi + 2n – 2xi + n + xi )
1
TDEV ( nτ 0 ) ≅ -----------------------------------------
2
6n ( N – 3n + 1 ) j=1 i=j
2
N – 3n + 1 n + j – 1
∑ ∑ ( xi + 2n– 2x i + n + xi )
1
MADEV ( nτ 0 ) ≅ -------------------------------------------------
4 2
2n τ 0 ( N – 3n + 1 ) j=1 i=j
N – 2n
∑ ( xi + 2n– 2x i + n + xi )
ADEV ( nτ 0 ) ≅ 1 2
----------------------------------------
2 2
2n τ 0 ( N – 2n ) i=j
Any situation where there is no common master clock controlling the timing signals between
which the time error is measured is referred to as an independent clock configuration. The time
error measured in independent clock configuration, besides being dependent on internal clock
noises, is affected by any frequency offset or frequency drift of the clocks involved in the
measurement. The “Frequency offset eliminate” check box in the “TIE analysis” window is used
to compensate for this situation.