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SurgeTest EPCOS
SurgeTest EPCOS
3 Applications
3.1 Protective circuits
The varistors must on all accounts be connected parallel to the electronic circuits to be protected.
Protected
Protected
SIOV Equipment
equipment
( -) N
VAR0382-E
Fuse
L2 Protected
Protected
equipment
Equipment
Fuse
L3
VAR0367-E
61 04/02
Applications
When varistors are used in line-to-ground circuits (figures 27a and 27b), the risk must be consid-
ered that a current type fuse may possibly not blow if the grounding resistance is too high and in
this way the current is limited. With regard to such cases, various international and local standards
do not allow the line-to-ground application of varistors without taking adequate safety countermea-
sures.
One possible solution is to use thermal fuses in series, which are thermally coupled with the varistor,
as indicated in figures 27a and 27b.
Fuse
L1
Protected
Protected
SIOV Equipment
equipment
N
SIOV SIOV
Thermal
ThermalCoupling
coupling Thermal fuse
Thermal Fuse
VAR0375-V
Fuse
L1
SIOV SIOV
Fuse
L2 Protected
Protected
equipment
Equipment
SIOV
Fuse
L3
SIOV
SIOV
ThermalCoupling
Thermal coupling
Thermal fuse
Thermal Fuse
VAR0383-M
62 04/02
Applications
SIOV
SIOV SIOV M
SIOV
3.2 CE conformity
A wide range of legislation and of harmonized standards have come into force and been published
in the field of EMC in the past few years. In the European Union, the EMC Directive 89/336/EEC of
the Council of the European Communites came into effect on the 1st of January 1996. As of this
date, all electronic equipment must comply with the protective aims of the EMC Directive. The con-
formity with the respective standards must be guaranteed by the manufacturer or importer in the
form of a declaration of conformity. A CE mark of conformity must be applied to all equipment [1].
As a matter of principle, all electrical or electronic equipment, installations and systems must meet
the protection requirements of the EMC Directive and/or national EMC legislation. A declaration of
conformity by the manufacturer or importer and a CE mark are required for most equipment. Excep-
tions to this rule and special rulings are described in detail in the EMC laws.
New, harmonized European standards have been drawn up in relation to the EEC’s EMC Directive
and the national EMC laws. These specify measurement techniques and limit values or severity
levels, both for interference emission and for the interference susceptibility (or rather, immunity to
interference) of electronic devices, equipment and systems.
The subdivision of the European standards into various categories (cf. table 3) makes it easier to
find the rules that apply to the respective equipment.
The generic standards always apply to all equipment for which there is no specific product family
standard or dedicated product standard.
Adherence to the standards for electromagnetic compatibility (EMC) is especially important.
These are:
■ Interference emission EN 61000-6-3 and EN 61000-6-4
■ Immunity to interference EN 61000-6-1 and EN 61000-6-2
63 04/02
Applications
Whereas regulations concerning maximum interference emission have been in existence for some
time, binding requirements concerning immunity to interference have only come into existence
since 1996 for many types of equipment. In this respect, in addition to having an optimum price/per-
formance ratio, SIOV varistors have proved themselves to be a reliable solution for all requirements
concerning overvoltages:
■ ESD (electrostatic discharge)
■ Burst (fast transients)
■ Surges, high-energy transients
The basic standards contain information on interference phenomena and general measuring
methods.
The following standards and regulations form the framework of the conformity tests:
Table 3
Generic standards
define the EMC environment in which a device is to operate according to its intended use
Basic standards
describe physical phenomena and measurement techniques
1) The standards given in parentheses are previous ones, which will remain valid for a transition period.
64 04/02
Applications
Table 3 (continued)
The following table shows the most important standards in the field of immunity to interference.
65 04/02
Applications
Table 3 (continued)
The IEC 61000 or EN 61000 series of standards are planned as central EMC standards into which
all EMC regulations (e. g. IEC 60801, IEC 60555) are to be integrated in the next few years.
3.3 ESD
100 MΩ 330 Ω
High-voltage
Hochspan- = 150 pF Device under test
Prüfling
source
nungsquelle
VAR0250-N
66 04/02
Applications
i*
A
100 %
90 %
60 %
30 %
10 %
t
0,7 ... 1 ns
30 ns
60 ns VAR0251-V
For these reasons, suitable overvoltage protection elements must meet the following requirements:
■ response time < 0,5 ns
■ bipolar characteristics
■ sufficient surge current handling capability
■ low protection level
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Applications
Metallic chassis
ESD
I/O
SIOV
VAR0369-U
68 04/02
Applications
Shielding
The extremely steep leading edges of short electrostatic discharge pulses induce strong electro-
magnetic fields which should be contained, i.e. shielded by metal casings or other measures.
Static discharge
Device type
susceptibility (V)
MOSFET 100– 200
GaAs FET 100–1000
EPROM 100
JFET 140–7000
CMOS 250– 300
Film Resistors 300–3000
For this reason, in most applications it is not always necessary to select the ESD protection com-
ponent with the lowest possible protection level. As explained in section 2.5.1, this procedure can
lead to electrical advantages (lower leakage currents, lower capacitance) and reduced costs (smaller
variety of components to be kept in stock).
For example, MLVs with up to 26 V DC are frequently used in mobile phones due to the above con-
sideration, although the operating voltage of cellular phones is currently only 3–5 V DC.
69 04/02
Applications
Response time
Metalization
Metal layer
VAR0377-L
Figure 33 shows the structure of MLVs, which achieves extremely low parasitic inductances and
permits response times of < 0,5 ns. Figure 34 shows the virtually delay-free response to a 4 kV ESD
impulse.
As opposed to this, if semiconductors are used, the response time is often increased to > 1 ns be-
cause of the inductance of the cases (cf. 1.7.9).
VAR0385-C
14
A
i 12
i peak = 13,6 A
8
0_
40 0 40 80 120 ns 160
t
70 04/02
Applications
Bipolar characteristics
ESD can occur with any polarity, which poses no problems for MLVs with their symmetrical protec-
tion characteristics, whereas two components are often required in order to achieve the required
bipolar characteristic with semiconductors.
Operating temperatures
As shown in figure 35, MLVs can be subjected to full load at temperatures of up to 125 °C, whereas
the load capacity of semiconductor components (e.g. suppressor diodes) derates from tempera-
tures of 25 °C upwards and is frequently reduced to 25 % of the rated value at 125 °C. For compen-
sation, an additional current-limiting resistor often has to be connected in series with semiconductor
circuits.
VAR0370-H
110
100
%
80
% of max. ratings
60
TVS Diodes
CT/CN0402...0603
40 CT/CN0805...2220
20
0
0 20 40 60 80 100 120 140 ˚C 160
TA
71 04/02
Applications
Size
The ceramic material of MLVs serves as an insulator on the exterior surfaces; the terminal elec-
trodes are available as direct contact surfaces.
By comparison, semiconductor components always require a casing. This makes them correspond-
ingly bulkier and they require more mounting space, (figure 36).
Ratio
3,3 : 1,0
72 04/02
Applications
The capacitance ratings listed in the product tables are typical values.
In general the following rules can be applied:
■ Higher capacitance values are achieved by selecting a larger chip
■ Lower capacitance values are achieved by selecting a smaller chip, or, where this is not possible,
a higher voltage class.
If a specific circuit or substitution calls for defined capacitance value tolerances, then EPCOS is pre-
pared to supply these specifically for the application as “controlled capacitance” versions.
Examples of special types with specified maximum capacitances are:
SIOV-CT0402V275RFG C < 3 pF see 3.3.9
SIOV-CT/CN0603K17LCG C < 50 pF see product tables
SIOV-CT/CN0805K17LCG C < 100 pF see product tables
More details on these types and on other special designs with different capacitance and tolerance
values can be supplied upon request.
a b
SIOV -
CT/CN ... LC ..
Current limiting CT/CN ... CC ..
resistor CT/CN ... HC ..
VAR0371-P VAR0379-B
73 04/02
Applications
Figure 38 Typical frequency response of the impedance (a) and the capacitance (b), using the
multilayer varistor SIOV-CN0805M6G as an example
74 04/02
Applications
PRm S 21
Cor
S 11
PRm
Cor
SWR – 1
* S11 = 20 log · -----------------------
SWR + 1
75 04/02
Applications
76 04/02
Applications
If this surge current is to be handled by a multilayer varistor, then, according to equation 12, the
effect of the varistor on this value of the current amplitude is negligible.
For CN0805M6G, for example, this means that:
V s – V SIOV 15 000 [ V ] – 45 [ V ]
iˆ * = --------------------------
- = --------------------------------------------------- » 45 A
Z source 330 [ W ]
By transforming the discharge current (figure 21) into an equivalent rectangular wave, we obtain
t*r » 40 ns.
No value can be deduced from the derating curves for such an extremely short current flow time.
The energy absorption of multilayer varistors during ESD discharges lies in the region of m J.
For the SIOV-CN0805M6G, for example, according to equation 16 this means that:
ˆ t * = 45 · 45 · 40 · 10-9 = 80 m J
W * = v̂ * i* r
Thus the largest part of the energy content of the ESD pulse is absorbed by the 330-W discharge
resistor.
All types of the SIOV-MLV series are able to meet the (severest) ESD test level 4 acc. to
IEC 61000-4-2. Figure 60 demonstrates this for multible pulses taking the CN0603M7G as an ex-
ample.
Due to the steep edge of the ESD pulse, the mechanical construction of a device is of great impor-
tance for the test result. The ESD varistor selection should therefore always be verified by a test
circuit.
3.4 Burst
According to IEC 61000-4-4, burst pulses are low-energy transients with steep edges and high rep-
etition rate. Thus, for equipment to pass burst testing successfully, design (line filter, grounding con-
cept, case) is as critical as the choice of the varistor. If IEC 61000-4-5 has been taken into account
when selecting varistors, they will normally also handle the burst pulse energy without any prob-
lems. Due to the steepness of the pulse edges, the varistors must be connected in a way which
keeps parasitic circuit inductance low. The EPCOS EMC laboratory will carry out tests upon request
(cf. 3.7).
77 04/02
Applications
Table 4
1) The electrical equivalent to the S05K460 would be a CU3225 version. Because this size is not available with 460 V
rating, the (oversized) CU4032K460G2 is specified here.
78 04/02
Applications
3.8.2 Transients
Standard ISO 7637 (DIN 40839), details the EMC in automotive electrical systems. The toughest
test for transient suppression is pulse 5, simulating load dump. This critical fault occurs when a bat-
tery is accidentally disconnected from the generator while the engine is running, e. g. because of a
broken cable. Under this condition peak voltages up to 200 V can occur, lasting for few hundred ms,
yielding energy levels up to 100 J. This worst case, as well as the other pulse loads, can be mas-
tered reliably using SIOV-AUTO varistors.
79 04/02
Applications
CAN Bus
Spark plugs
Battery + Ignition
3-phase
coil
alternator
GS Distributor
Light
Relay Relay Relay
Regulator Ultra- M
Cap Starter Ignition
module
Electric power source Power Integrated Motor management Lighting CAN Bus
source starter protection
protection generator
VAR0544-E-E
80 04/02
Applications
3.8.4 Tests
Maintenance of EMC requirements can be checked with conventional test generators. Figures 41a
and b show block diagrams for load dump tests with operating voltage applied. The electrical per-
formance associated with a load dump of 100 J is illustrated in figures 42a to c.
Note:
Circuit 41b produces the test pulse 5 according to ISO 7637 (DIN 40 839); the 10 % time constant
td can be set independently of the battery voltage. Note that the maximum discharge current is not
limited by the source V DC.
Figure 41a Principle of load dump generator with battery connected in parallel
Charging
Controller
circuit
Typical values
C0 4,7 … 47 mF
R0 4… 5W
C1 47 … 470 m F
Ri 0,5 … 5 W
Varistor
VL 0 … 200 V
under VDC 12 … 28 V
test td 40 … 500 ms
v SIOV Protection level
Shunt of varistor
iv Current
through varistor
Figure 41b Principle of load dump generator with battery connected in series
81 04/02
Applications
42a
Test pulse 5
acc. ISO 7637
(DIN 40 839)
42b
Example:
C0 37,6 mF
R0 4,6 W
without C1 47 m F
VS 146 V
SIOV-S20K14AUTO V DC 14 V
Ri 2W
with
td 400 ms
tr 0,1 ms
42c
82 04/02
Applications
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Applications
LW MW SW FM
without suppression
2 ´ 8 mH + SHCV (0,47 mF)
2 ´ 8 mH + SHCV (1,50 mF)
Suppression level 5
Figure 43 Example of RFI suppression in small motors with chokes and SHCVs
(measured to VDE 0879, part 3)
3.9 Telecommunications
Electromagnetic interference on telecommunications, signal and control lines can be quite consid-
erable as these lines tend to be long and exposed. So the requirements are correspondingly high
when it comes to the electromagnetic compatibility of connected components or equipment.
84 04/02
Applications
The easiest method of selecting a varistor is to use PSpice simulation to select a varistor for given
requirements. In 3.10.2, the calculation shows if SIOV-S10K95 is acceptable.
Figure 44 Circuit for generating 10/700 m s test pulse to ITU-T and IEC 61000-4-5
85 04/02
Applications
V = f (I ) V/I characteristic
Cp Varistor capacitance
Ls Series inductance
RS = 100 mW Series resistance
In the model, the V/I characteristic curve is implemented by a controlled voltage source V = f (I ). An
additional series resistance Rs = 100 mW has been inserted in order to prevent the unpermissible
state which would occur if ideal sources were to be connected in parallel or the varistor model were
to be connected directly to a source.
The following approximation is used for the mathematical description:
log V = b1 + b2 · log (I ) + b3 · e-log (I ) + b4 · elog (I ) I>0 (equ. 21)
This means that the characteristic curve for any specific varistor can be described by the parame-
ters b1 … b4. Figure 46 shows the typical V/I characteristic curve for the varistor SIOV-S20K275
and the corresponding parameters b1 … b4.
The tolerance bandwidth of the V/I characteristic curve can be shifted (cf. figure 7) in order to in-
clude cases of
■ upper tolerance bandwidth limit:
highest possible protection level for a given surge current, and
■ lower tolerance bandwidth limit:
highest possible (leakage) current for a given voltage.
86 04/02
Applications
b1 = 2.7233755
b2 = 0.0258453
b3 = 0.0005746
b4 = 0.0046033
In the model, the capacitance values stated in the product tables are used. The dependence of the
capacitance on the applied voltage and frequency is extremely low and can be neglected here.
It is not permissible to neglect the inductance of the varistor in applications with steep pulse leading
edges. For this reason, it is represented by a series inductance and essentially is determined by the
lead inductance. As opposed to this, the internal inductance of the metal oxide varistor may be ne-
glected. The inductance values in the model library are chosen for typical applications, e.g. approx.
13 nH for the S20K275. If longer leads are used, insertion of additional inductances must be con-
sidered, if necessary. In the case of disk varistors, the inductance of the leads is approx. 1 nH/mm.
The PSpice simulation models can be downloaded from the Internet (www.epcos.com/tools).
87 04/02
Applications
Figure 47 Simulation of the test pulse 10/700 m s applied to the device under test S10K95
For the varistor, the upper characteristic curve tolerance (TOL = +10) limit is used to simulate the
worst case i.e. highest possible protection level. It is not considered necessary to model the device
to be protected in this diagram, since, in relation to the varistor, this is generally of higher resistance
for pulse loads.
Figure 48 shows the curve of the open-circuit voltage (varistor disconnected) and the maximum pro-
tection level (with varistor).
Surge current
ò
Figure 49 shows the voltage and current curves, with the i * d t included in the drawing.
A maximum current of 44 A can be deduced from the curves.
Then, according to equation 14:
òi *d t
17 mAs
t *r = -------------- = -------------------- » 386 m s
iˆ* 44 A
According to figure 50, the resulting maximum surge current for 10 loads is imax = 48 A > iˆ* = 44 A.
The selection criterion of equ. 9 is fulfilled.
88 04/02
Applications
Energy absorption
PSpice displays the energy absorption directly as W * = ò v*i*d t = 4,2 J.
The resulting permissible time interval between two pulses according to equ. 20 is:
W * = 4,2 J = 10,5 s
T min = -----------
- ---------------
P max 0,4 W
This means that the requirement of a minimum time interval between pulses of 60 s or more is ful-
filled.
Open-circuit voltage v *
89 04/02
Applications
Figure 49 PSpice simulation: voltage, current and ò i*d t curves for the S10K95
Figure 50 A maximum surge current imax = 48 A (10 times) can be deduced for t *r = 386 m s
from the derating curves for S10K50 … 320
90 04/02
Applications
[1] Shortform catalog “Gas-Filled Surge Arresters”, ordering no. EPC: 48001-7400
[2] Data book “EMC Filters”, ordering no. EPC: 24004-7600
*) Not in the EPCOS product range
91 04/02
Applications
Surge
voltage wave
Figure 51 Principle of stepped protection with surge arrester, varistor and suppressor diode
52a 52b
Series Cable Unit
Cable impedance Unit
Ground or
Ground or neutral
neutral
92 04/02
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(
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