Hitachi OES
Hitachi OES
SERIES
Floor stand version
Models
OE720: 162 kg (357 lbs)
OE750 / OE720
OE750: 166 kg (366 lbs)
Options
Adapters
Spart parts kit
Desktop version
Consumable kit 1250 mm
Sample preparation device OE720: 84 kg (185 lbs) (50")
OE750: 88 kg (194 lbs)
Floor stand
535 mm
(21")
760 mm
(29.9")
760 mm
(29.9") 425 mm
(16.7")
425 mm
(16.7")
• LightWing technology: Multi-CMOS optics in Paschen-Runge • Quality control for process and melt verification:
mounting and optimized pixel resolution analysis mode / grade identification
• Focal length: 400 mm • All relevant alloying, residual, treatment, trace and tramp
• Wave length: OE720: 119 - 670* nm / OE750: 174 - 670* nm elements with low limits of detection
(*766 nm on request) • Fe: Alloys, cast iron alloys incl. N down to 10 ppm (OE750 only)
• Peak position alignment • Al: Alloys, cast alloys, wrought alloys…
• Cu: Bronze, Brass, Cu-Ni…
Argon supply • Ni: hasteloy, inconel, monel, incl. N down to 20 ppm
• Ti: Ti pure, Ti.6-4, Ti.8-Mn, incl. gases such as H, O, N (OE750
• Argon quality: min 4.8 (=99.998 % Ar) only)
5.0, if analysis of gases is required (OE750 only) • Mg, Co, Pb, Sn, Zn alloys, solders and more
• Input pressure: 3 bar
This publication is the copyright of Hitachi High-Tech Analytical Science and provides outline information only, which (unless agreed by the company in writing) may not be used,
applied or reproduced for any purpose or form part of any order or contract or regarded as the representation relating to the products or services concerned. Hitachi High-Tech
Analytical Science’s policy is one of continued improvement. The company reserves the right to alter, without notice the specification, design or conditions of supply of any
product or service.