IL78xx 03
IL78xx 03
IL7805 ~ IL7818 VI 35
Input Voltage V
IL7824 VI 40
* Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device.
These are stress ratings only and functional operation of the device at these or any other conditions beyond those
indicated under “recommended operating conditions” is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
IL78xx
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Tj = VI = 8V to 25V 5 120
Line Regulation △Vo
25° C VI = 9V to 13V 1.5 60
mV
Tj = Io = 5.0mA to 1.5A 9 120
Load Regulation △Vo
25° C Io = 250mA to 750mA 3 60
Quiescent current Iq Tj = 25° C 5 8 mA
Io = 5mA to 1A 0.5
Quiescent current
△Iq VI = 8V to 25V 1.3 mA
Change
VI = 9V to 25V
Output voltage Drift △Vo /△T Io = 5mA -0.8 mV/° C
Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25° C 45 ㎶
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Io = 5mA to 1A 0.5
Quiescent current
∆Iq VI = 11.5V to 26V 1.3 mA
Change
VI = 12.5V to 26V
Output voltage Drift ∆Vo/∆T Io = 5mA -1 mV/° C
Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25° C 58 ㎶
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Io = 5mA to 1A 0.5
Quiescent current
∆Iq VI = 12.5V to 29V 1 mA
Change
VI = 13.5V to 29V
Output voltage Drift ∆Vo/∆T Io = 5mA -1 mV/° C
Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25° C 58 ㎶
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Io = 5mA to 1A 0.5
Quiescent current
∆Iq VI = 17.5V to 30V 1.0 mA
Change
VI = 18.5V to 30V
Output voltage Drift ∆Vo/∆T Io = 5mA -1 mV/° C
Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25° C 90 ㎶
Ripple Rejection RR f = 120Hz, VI = 18.5V to 28.5V 54 70 dB
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Io = 5mA to 1A 0.5
Quiescent current
∆Iq VI = 21V to 33V 1.0 mA
Change
VI = 22V to 33V
Output voltage Drift ∆Vo/∆T Io = 5mA -1 mV/° C
Output noise voltage Vn f = 10Hz to 100KHz, Ta = 25° C 110 ㎶
Ripple Rejection RR f = 120Hz, VI = 22V to 32V 53 69 dB
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
* Load and lone regulation are specified at constant junction temperature. Changes in Vo due to heating effects
must be taken into account separately. Pulse testing with low duty is used.
Output Voltage Change vs. Junction Temperature Otput Voltage as a Function of Input Voltage
TYPICAL APPLICATIONS
DC Parameters
Load Regulation
Ripple Rejection
Notes:
1. To specify an output voltage, substitute voltage value for “XX.” A common ground is required between the input and the output
voltage. The input voltage must remain typically 2.0V above the output voltage even during the low point on the input ripple voltage.
2. CI is required if regulator is located an appreciable distance from power supply filter.
3. CO improves stability and transient response.
Switching Regulator