Professional Documents
Culture Documents
Icp-Aes S1
Icp-Aes S1
=
Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
Atomic spectrometry
Atomic Absorption
Atomic Emission
Light and heat energy from high
intensity source (flame or
plasma)
Mass Spectrometry
Characteristics of instruments
Detection
Merit
ICP-MS
ICP-AES
mass
emission
absorbance
multielement
high sensitivity
damage from
high salinity
relatively low
sensitivity
monoelement
< ppt
100 ppb
0.1 ppb
10 ppm
high sensitivity
GF-AAS
multielement
Demerit
Ranges
1 ppb
100 ppb
Introduction to ICP-AES
Advantages of plasma
Simultaneous multi-element Analysis saves
sample amount
Some non-metal determination (Cl, Br, I, and S)
Concentration range of several decades (wide
range)
Enable high resolution
Disadvantages of plasma
very complex Spectra - hundreds to thousands of
lines
Expensive optical components
Expensive instruments, highly trained personnel
required
Atomization
i.
ii.
Basic steps:
a) nebulization solution sample, get into fine droplets by spraying through thin nozzle
b) desolvation - heat droplets to evaporate off solvent just leaving analyte and other
matrix compounds
c) volatilization convert solid analyte/matrix particles into gas phase
d) dissociation break-up molecules in gas phase into atoms.
e) excitation and ionization with light, heat, etc. for spectra measurement.->cause the
atoms to become charged
Excitation and ionization/
Evaporation/
Vapouration /
Dissociation
Torch
Magnetic field
Ar charges
by Tesla coil
(high voltages at high frequency)
Temperature Regions
in Plasma Torch
Plasma characteristics
Hotter than flame (10,000 K) more complete atomization/
excitation
Atomized in "inert" atmosphere
Ionization interference due to high
density of e- is very small
Sample atoms reside in plasma for
~2 msec
Plasma chemically inert, little oxide
formation
Temperature profile quite stable
and uniform.
Instrumentation of ICP-AES
1.
2.
3.
4.
5.
Tail flame
Fireball
Spectrometer
Induction cell
Radiofrequency
generator
PMT
Coolant gas
Torch
Auxiliary gas
Sample capillary
Coating gas
Nebulizer
Computer
Computer
Peristaltic
purge
Spray chamber
Injector
gas
Sample
solution
To drain
A. RF Generator
Radio-Frequency (RF) Generator is a device that is used to
provide the power required for the generation and sustaining of
the plasma discharge.
Peristaltic Pump
Scott chamber
- traditional equipment
- large volume
Cyclonic chamber
more aerosol
smaller volume
better wash out
(3) Nebulizer
Torch
Plasma Torches
The plasma torch consists of three concentric quartz tubes
through which the gas (normally argon) flows:
- The outer tube contains the coolant gas flow, which
spirally flows tangentially through the torch at a high
velocity. This assists in cooling the torch and hence
prevents damage.
- The middle tube contains the auxiliary gas flow to
keep the plasma discharge away from the auxiliary
and nebulizer tubes
- The innermost tube has the nebulizer gas flow which
carries the sample aerosol to the plasma.
4. Spectrometer (Polychromator)
The role of a spectrometer is to isolate the analytical wavelengths of interest
from the light emitted by the plasma source.
The advantage of polychromators is:
- capable of determining several analytes simultaneously.
- high sample throughput
- lower running cost
Echelle Polychromator
5. Detectors
Commonly used detectors:
Photomultiplier tubes (PMT)
Solid-state detectors:
Charge-coupled devices (CCD)arrays detector
Silicon photodiodes with thousands of individual
elements
Very sensitive, very well-suited to echelle grating
polychromators, very fast
Schematic diagram of
an end-on PMT
PMT consists of a photo-sensitive cathode and a series of dynodes, which are set at successively
more positive potentials until an anode is reached. Light comes from the plasma, passes through
the transparent casing of the multiplier and strikes cathode. This then emits electrons, which are
accelerated down the dynode chain. Each time an electron impacts with a dynode, a number of
CCD
Examples of the wavelength ranges covered
by individual CCD chips:
Chip 1
Chip 2
Chip 3
Chip 4
Chip 5
Chip 6
Chip 7
127,000 - 142,125 nm
141,285 - 160,681 nm
160,040 - 179,618 nm
178,704 - 198,477 nm
197,023 - 216,947 nm
215,903 - 235,897 nm
234,792 - 254,788 nm
Second Grating
2400 l/mm
K 766nm
First Grating
2924 l/mm
Li 670nm
Na 589nm
125nm
Entrance Slit
460nm
Multi CCD
Detection Limit
Element Wavelength (nm)
axial (ug/L)
Ag
328.068
0.5
Al
396.152
0.9
As
188.98
3
As
193.696
4
Ba
233.527
0.1
Ba
455.403
0.03
Ba
455.403
0.03
Be
313.107
0.05
Ca
396.847
0.01
Ca
317.933
0.8
Cd
214.439
0.2
Co
238.892
0.4
Cr
267.716
0.5
Cu
327.395
0.9
Fe
238.204
0.3
K
766.491
0.3
Li
670.783
0.06
Mg
279.55
0.05
Mg
279.8
1.5
Mn
257.61
0.1
Mo
202.03
0.5
Na
589.59
0.2
Ni
231.6
0.7
P
177.43
4
Pb
220.35
1.5
Rb
780.03
1
S
181.972
4
Sb
206.83
3
Se
196.03
4
Sr
407.77
0.02
Sn
189.93
2
Ti
336.12
0.5
Tl
190.79
2
V
292.4
0.7
Zn
213.86
0.2
Detection limit
radial (ug/L)
1
4
12
11
0.7
0.15
0.15
0.15
0.3
6.5
0.5
1.2
1
1.5
0.9
4
1
0.1
10
0.133
2
1.5
2.1
25
8
5
13
16
16
0.1
8
1
13
2
0.8
Sample preparation
For many applications, the sample analyzed by ICP-AES will not be in
suitable form . In order to transform solid samples into suitable form
, sample pre-treatment is required.
The pre-treatment method used will be depend on the nature
of the sample and the element which are to be determined.
Those methods commonly used are:
- Dry-ash,
- Acid digestion,
- Fusion,
- Solubilization
- Microwave digestion.
Ash at 200-800
crucible
sample
Acid Digestion
Use of strongly oxidizing mineral acid, such
as HNO3, HF, H2SO4 and HClO4 to oxidize
the resistant components, with gentle heat.
It can be carried out in closed or open
reaction systems. Closed systems minimize
the losses in volatilization.
Advantages:
Disadvantages:
Muffle
furnace
Dissolved in HNO3.
Fusion methods are commonly used with geological samples. crucible Sample + Flux
Advantages:
Disadvantages:
Plug
Safety Disk
Seal
Screw Cap
Supporting Vessel
Pressure vessel (TFM)
Liner
Bomb Jacket
Vessel Base Plate
Digestion vessels carefully acid washed and rinsed with water before use.
(For soils, sediments, and sludge use no more than 0.50 g. For oils use no more than 0.25 g.)
Sample vessel equipped with a single-port cap and a pressure relief valve.
The vessels are capped and heated by a suitable laboratory microwave unit.
The vessel contents are filtered, centrifuged, or allowed to settle and then
diluted to volume and analyzed.
Advantages:
Disadvantages:
ICP/AES INTERFERENCES
Spectral Interferences
Physical Interferences
Chemical Interferences
Memory Effect
Spectral interferences:
caused by background emission from continuous or recombination phenomena,
stray light from the line emission of high concentration elements,
overlap of a spectral line from another element,
or unresolved overlap of molecular band spectra.
Corrections
Background emission and stray light compensated for by subtracting
background emission determined by measurements adjacent to the analyte
wavelength peak.
Correction factors can be applied if interference is well characterized
Inter-element corrections will vary for the same emission line among
instruments because of differences in resolution, as determined by the
grating, the entrance and exit slit widths, and by the order of dispersion.
Physical interferences
Cause
effects associated with the sample nebulization and transport
processes.
Changes in viscosity and surface tension can cause significant
inaccuracies,
especially in samples containing high dissolved solids
or high acid concentrations.
Salt build up at the tip of the nebulizer, affecting aerosol flow rate
and nebulization.
Reduction
Physical interferences
Wavelength calibration
Chemical interferences:
include molecular compound formation
Normally, this effect is not significant with the
ICP technique.
Chemical interferences are highly dependent
on matrix type and the specific analyte
element.
Combined Effects
Memory interferences:
When analytes in a previous sample contribute to the
signals measured in a new sample.
Memory effects can result
from sample deposition on the uptake tubing to the nebulizer
from the build up of sample material in the plasma torch and
spray chamber.